BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//kigkonsult.se//NONSGML kigkonsult.se iCalcreator 2.41.92//
CALSCALE:GREGORIAN
UID:35626438-3137-4532-a538-653264663635
BEGIN:VTIMEZONE
TZID:UTC
END:VTIMEZONE
BEGIN:VEVENT
UID:65303032-6138-4135-b061-623730636437
DTSTAMP:20261115T214635Z
CLASS:PUBLIC
DESCRIPTION:This training event will focus on the basic imaging and operati
 on of the Zeiss SEM's available at MIT.nano Characterization Facilities. U
 sers will learn about specifics of the tool configuration\, different imag
 ing detectors available and strategies for image quality improvement. User
 s can bring their own samples for this training. Full independent tool acc
 ess will be granted upon completion of 2 additional one-on-one supervised 
 use sessions that will be coordinated with the staff member during this sm
 all group training.
DTSTART:20231005T140000Z
DTEND:20231005T160000Z
LOCATION:MIT.nano 12-0191
SEQUENCE:1
SUMMARY:Zeiss SEM training -Oct 5
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR