BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//kigkonsult.se//NONSGML kigkonsult.se iCalcreator 2.41.92//
CALSCALE:GREGORIAN
UID:37643130-6564-4435-b662-393063313237
BEGIN:VTIMEZONE
TZID:UTC
END:VTIMEZONE
BEGIN:VEVENT
UID:34643064-6135-4531-a632-663866346536
DTSTAMP:20261017T150234Z
CLASS:PUBLIC
DESCRIPTION:This training event will focus on the basic imaging and operati
 on of the Zeiss Merlin SEM available at MIT.nano Characterization Faciliti
 es. Users will learn about specifics of the tool configuration\, different
  imaging detectors available and strategies for image quality improvement.
  Users can bring their own samples for this training. Full independent too
 l access will be granted upon completion of 2 additional one-on-one superv
 ised use sessions that will be coordinated with the staff member during th
 is small group training.
DTSTART:20240116T183000Z
DTEND:20240116T203000Z
LOCATION:MIT.nano 13-1026
SEQUENCE:1
SUMMARY:Zeiss Merlin SEM instrument specific training -Jan 16
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR