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VERSION:2.0
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CALSCALE:GREGORIAN
UID:39653963-3431-4832-b030-633732343265
BEGIN:VTIMEZONE
TZID:UTC
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BEGIN:VEVENT
UID:65343934-6533-4130-b439-643363396562
DTSTAMP:20261017T170044Z
CLASS:PUBLIC
DESCRIPTION:This course will teach you how to profile fit data in the progr
 am HighScore Plus.  Profile fitting is the first step to quantification of
  XRPD data.  Profile fitting allows a user to extract precise information 
 about peak position\, intensity\, and width. Once XRPD data have been prof
 ile fit\, a variety of calculations are possible. This session will focus 
 on refining unit cell lattice parameters\, indexing diffraction data\, % c
 rystallinity\, and calculating the relative weight fractions of phases in 
 a mixture (quantitative phase analysis). \n \nAdditional workshops will fo
 cus on calculating nanocrystallite size and microstrain from peak broadeni
 ng.
DTSTART:20240223T180000Z
DTEND:20240223T200000Z
LOCATION:13-4041 (Campus Map: https://whereis.mit.edu/ )
SEQUENCE:1
SUMMARY:Advanced XRPD Data Analysis Workshop – Structure Models and Profile
  Fitting - Feb 23
TRANSP:OPAQUE
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