BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//kigkonsult.se//NONSGML kigkonsult.se iCalcreator 2.41.92//
CALSCALE:GREGORIAN
UID:65623732-3037-4732-b462-343735373534
BEGIN:VTIMEZONE
TZID:UTC
END:VTIMEZONE
BEGIN:VEVENT
UID:37383134-3934-4864-a233-313936376330
DTSTAMP:20261008T003454Z
CLASS:PUBLIC
DESCRIPTION:This training event will focus on the basic imaging and operati
 on of the Bruker Icon AFM available at MIT.nano Characterization Facilitie
 s. Starting from the basic principles of AFM\, users will also learn about
  cantilever selection and installation\, different imaging modes\, image q
 uality improvement\, and data processing and analysis methods. Users can b
 ring their own samples for this training and SPM probes are provided. Noti
 ce\, users must supply their own probes for followup qualification session
 s. Full independent tool access will be granted upon completion of 2 addit
 ional one-on-one supervised use sessions that will be coordinated with the
  staff member during this small group training. 
DTSTART:20240312T173000Z
DTEND:20240312T193000Z
LOCATION:MIT.nano 13-4148
SEQUENCE:1
SUMMARY:Bruker Icon XR AFM Basic Training- March 12
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR