BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//kigkonsult.se//NONSGML kigkonsult.se iCalcreator 2.41.92//
CALSCALE:GREGORIAN
UID:36383464-6139-4232-b538-613235353961
BEGIN:VTIMEZONE
TZID:UTC
END:VTIMEZONE
BEGIN:VEVENT
UID:37373433-6461-4661-a431-633864343636
DTSTAMP:20261017T180015Z
CLASS:PUBLIC
DESCRIPTION:This training event will focus on the basic imaging and operati
 on of the Zeiss SEM's available at MIT.nano Characterization Facilities. U
 sers will learn about specifics of the tool configuration\, different imag
 ing detectors available and strategies for image quality improvement. User
 s can bring their own samples for this training. Full independent tool acc
 ess will be granted upon completion of 2 additional one-on-one supervised 
 use sessions that will be coordinated with the staff member during this sm
 all group training.
DTSTART:20240307T150000Z
DTEND:20240307T170000Z
LOCATION:MIT.nano 13-1026
SEQUENCE:1
SUMMARY:Zeiss Merlin SEM training -March 7
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR