BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//kigkonsult.se//NONSGML kigkonsult.se iCalcreator 2.41.92//
CALSCALE:GREGORIAN
UID:35663931-3762-4438-a138-306163373139
BEGIN:VTIMEZONE
TZID:UTC
END:VTIMEZONE
BEGIN:VEVENT
UID:34613237-6164-4965-a535-363232363465
DTSTAMP:20261108T172128Z
CLASS:PUBLIC
DESCRIPTION:This training event will focus on the basic imaging and operati
 on of the Zeiss SEM's available at MIT.nano Characterization Facilities. U
 sers will learn about specifics of the tool configuration\, different imag
 ing detectors available and strategies for image quality improvement. User
 s can bring their own samples for this training. Full independent tool acc
 ess will be granted upon completion of 2 additional one-on-one supervised 
 use sessions that will be coordinated with the staff member during this sm
 all group training.
DTSTART:20240404T140000Z
DTEND:20240404T160000Z
LOCATION:MIT.nano 13-1026
SEQUENCE:1
SUMMARY:Zeiss Merlin SEM training -Apr 4
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR