BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//kigkonsult.se//NONSGML kigkonsult.se iCalcreator 2.41.92//
CALSCALE:GREGORIAN
UID:65626630-3265-4738-b636-363633333937
BEGIN:VTIMEZONE
TZID:UTC
END:VTIMEZONE
BEGIN:VEVENT
UID:37336664-3339-4831-a132-353638383932
DTSTAMP:20261017T202158Z
CLASS:PUBLIC
DESCRIPTION:This training event will focus on the basic imaging and operati
 on of the Zeiss SEM's available at MIT.nano Characterization Facilities. U
 sers will learn about specifics of the tool configuration\, different imag
 ing detectors available and strategies for image quality improvement. User
 s can bring their own samples for this training. Full independent tool acc
 ess will be granted upon completion of 2 additional one-on-one supervised 
 use sessions that will be coordinated with the staff member during this sm
 all group training.
DTSTART:20240418T140000Z
DTEND:20240418T160000Z
LOCATION:MIT.nano 13-1026
SEQUENCE:1
SUMMARY:Zeiss Merlin SEM training -Apr 18
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR