About Characterization.nano

Characterization.nano provides an umbrella for a set of shared focus facilities where users can carry out controlled characterization of micro, nano, and sub-nanoscale structures.

We are assembling state-of-the-art toolsets for dimensional science of surfaces and interfaces, advanced imaging, spectroscopy, and nanoscale analysis that will promote technological innovation and serve as a hub for scientists with widely different expertise. 

To take advantage of these tools, first follow these steps to become a user.

 

Location

The majority of the characterization, metrology, and microscopy toolsets can be found in the basement floor of MIT.nano. Designed and constructed to minimize mechanical-vibrational and electro-magnetic interference, this lower-level is home to an array of highly-sensitive microscopes and other instrumentation for seeing and measuring at the nanoscale. 

Additional toolsets are spread throughout the building and can be found in the MIT.nano cleanroom and prototyping spaces.