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Characterization.nano Focus Facilities

Browse instruments by facility below, or jump to Search Instruments directly.

Explore Characterization.nano capabilities by focus facilities

Cypher microscope at MIT.nano

Atomic Force Microscopy

SEM mineral

Cleanroom Metrology

Cryo-EM (Cryogenic Imaging and specimen preparation)

The Themis microscope at MIT.nano

Electron Microscopy

Quantum Design Inc. Magnetic Property Measurement System (MPMS-3)

Magnetic Materials Characterization

CryoEM Sample Prep

Materials Prep Equipment

WITec alpha 300 apyron Confocal Raman

Optical Spectroscopy

PHI VersaProbe II X-ray Photoelectron Spectrometer

Surface Analysis

ZEISS Xradia 620 Versa X-ray microscope

X-Ray Diffraction & Imaging