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Note: Some smaller tools may not have individual pages here but can be found listed on specific Focus Facility pages (e.g., Cleanroom Metrology, Materials Prep). >>>Click here to return to Browse by Focus Facility page.

Atomic force microscopy

Agilent 5500 AFM

Asylum Research Cypher VRS AFM

Bruker Dimension Icon SPM

Cleanroom metrology

Asylum Research Jupiter XR AFM

Hitachi Regulus 8100 SEM

NanoOne 3D Printer from UpNano

Zeiss Sigma 300 SEM


Aquilos Cryo-FIB/SEM


Talos Arctica G2 Cryo-TEM

Titan Krios G3i Cryo-TEM

Vitrobot Mark IV

Electron-beam lithography

Elionix F125

Elionix HS-50

Electron microscopy

FEI Helios Nanolab 600 Dual Beam System

FEI Tecnai Multipurpose Digital TEM


Gemini 450 SEM

Hitachi HF 5000 Environmental S/TEM

JEOL 2010 FEG Analytical Electron Microscope

JEOL 2011 High Contrast TEM


Themis Z G3 Cs-Corrected S/TEM

Zeiss Merlin High-resolution SEM

Magnetic materials characterization

Quantum Design Inc. Magnetic Property Measurement System (MPMS-3)

Optical spectroscopy

Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer

Perkin Elmer 1050 UVVISNIR Spectrophotometer

Renishaw Invia Reflex Micro Raman

Thermo Fisher FTIR6700 Fourier Transform Infrared Spectrometer

Thermo Fisher Nicolet iS50 Fourier Transform Infrared Spectrometer and Continuum FTIR Microscope

WITec alpha300 apyron Confocal Raman

Surface analysis

Bruker Dektak DXT-A Stylus Profilometer

PHI VersaProbe II X-ray Photoelectron Spectrometer

Physical Electronics Model 700 Scanning Auger Nanoprobe

Quartz Crystal Microbalance with Dissipation

X-Ray diffraction & imaging

Bruker D8 GADDS

Bruker D8 HRXRD

Bruker Tracer-iii Handheld XRF

Multiwire Labs Back-Reflection Laue

PANalytical Empyrean

PANalytical X’Pert PRO

Rigaku SmartLab


ZEISS Xradia 620 Versa X-ray microscope