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Asylum Research Jupiter XR AFM

Jupiter XR features:

  • High speed and high resolution with fully-addressable stage that can reach any point on samples up to 200 mm in diameter

  • Extended-range scanner provides large 100 μm X-Y & 12 μm Z scan range
  • Modular and flexible design with various accessories

  • blueDrive Photothermal Excitation

  • Compatible with most commercial cantilever probes up to 8MHz resonance frequency.

    Specifications/Capabilities

    Enables range of imaging modes including:

    • Topography (Roughness, step-heights)
    • Mechanical properties (FDC, FMAP, BiMODAL, AM-FM, CR)
    • Electrical properties (CAFM, EFM, KPFM, PFM)
    • Magnetic properties (MFM)
    Jupiter AFM at Characterization.nano
    Location

    MIT.nano Cleanroom

    Staff/Contact

    Kurt Broderic 
    12-5003

    CONTACT

    Rami Dana, PhD                           
    12-0195                     

    UPCOMING TRAININGS

    ASSISTED USE / TRAINING REQUEST