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Asylum Research Jupiter XR AFM

Jupiter XR features:

  • High speed and high resolution with fully-addressable stage that can reach any point on samples up to 200 mm in diameter

  • Extended-range scanner provides large 100 μm X-Y & 12 μm Z scan range
  • Modular and flexible design with various accessories

  • blueDrive Photothermal Excitation

  • Compatible with most commercial cantilever probes up to 8MHz resonance frequency.

Specifications/Capabilities

Enables range of imaging modes including:

  • Topography (Roughness, step-heights)
  • Mechanical properties (FDC, FMAP, BiMODAL, AM-FM, CR)
  • Electrical properties (CAFM, EFM, KPFM, PFM)
  • Magnetic properties (MFM)
Staff/Contact

Kurt Broderick 
12-5003

Rami Dana, PhD                           
12-0195                     

CONTACT

ASSISTED USE / TRAINING REQUEST

UPCOMING TRAININGS
 

Jupiter AFM at Characterization.nano
Location

MIT.nano Cleanroom