The Sigma 300 SEM, from Zeiss, is a field emission scanning electron microscope. The instrument is located in the lower level cleanroom of MIT.nano and offers a superior low kV performance approaching 1.5 nm at 1kV.
Specifications/Capabilities
- Magnification: x10-1M
- Acceleration: Voltage 0.02-30kV
- Probe current: 3pA-20nA
- 5-axes motorized eucentric specimen stage (X,Y=130mm, Z=50mm, T=-3deg-70deg, R-360deg)
Detectors
- Everhart Thornley Secondary Electron Detector
- Inlens Secondary Electron Detector

Location
MIT.nano lower level cleanroom 16L (1110FD)
60 Vassar Street (rear)
Cambridge, MA
Rates/$
Self Use ($/hr) |
Staff Assisted ($/hr) |
|||
MIT Academics | 60.20 | 137.50 | ||
Other Academics | 86.00 | 196.00 | ||
External | 214.50 | 588.00 |
* Introductory rates valid for 2020
Reservation Rules
Obtaining access to the cleanroom is a prerequisite for SIGMA 300 SEM training and usage
Staff/Contact