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ZEISS Xradia 620 Versa X-ray microscope

ZEISS Xradia 620 Versa can non-destructively characterize the 3D microstructure of materials under controlled perturbations (in situ), and observe the evolution of structures over time (4D). By leveraging Resolution at a Distance, the Xradia Versa maintains highest resolution across large working distances, accommodating both sample, environmental chamber, and high precision in-situ load rigs without sacrificing resolution. 

  • High power (25 W) X-Ray Source with energy range of 30 – 160 keV
  • Fully automatic control (filters, detectors, objectives) and reconstruction
  • High spatial resolution ~500 nm
  • A two-stage magnification- high resolution imaging at large working distances (RaaD)
  • Versatile sample sizes and types – stage travel range: X – 50 mm, Y – 100 mm, Z – 50 mm 
  • Integrated in-situ testing stages
  • DragonFly Pro for advanced 3D visualization and analysis
Versa XRM

MIT.nano (basement level)
60 Vassar Street (rear)
Cambridge, MA