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JEOL 2010 FEG Analytical Electron Microscope

A multipurpose high resolution analytical electron microscope with high resolution image quality and high analytical performance, EDS X-ray analysis. The system is also equipped with a Gatan image filter (GIF) for EELS and energy filtered imaging, and a scanning image observation device (ASID), and 3 CCD cameras for various applications.

Staff/Contact

Yong Zhang
13-1027

JEOL 2010 FEG Analytical Electron Microscope
Location

13-1012
60 Vassar Street
Cambridge, MA 02139