Instruments FEI Tecnai Multipurpose Digital TEM FEI Helios Nanolab 600 Dual Beam System Gemini 450 SEM Hitachi HF500 Environmental S/TEM JEOL 2010 FEG Analytical Electron Microscope JEOL 2011 High Contrast TEM Sigma HD VP SEM Themis Z G3 Cs-Corrected S/TEM Velion FIB-SEM Zeiss Merlin High-resolution SEM See scheduled group trainings for Electron Microscopy instruments
