The Multiwire Labs Back-Reflection Laue is a single-crystal diffractometer that uses a polychromatic X-ray beam to simultaneously observe multiple diffraction peaks. The Laue uses the back-reflected X-rays to determine the orientation of single-crystal samples.
Specifications/Capabilities
- 5-axis sample stage for sample positioning and alignment
- Tunable source voltage and current (max 30 keV, 30 mA)
- Built-in orientation software for indexing collected reflections
- X-ray Source: Sealed tube: tungsten target
- Detectors: Multiwire Labs MWL120 2D area detector
Related Tools
Bruker D8 GADDS
Staff/Contact
Jordan Cox, Ph.D
13-4027
Building 13
60 Vassar Street
Cambridge, MA
Charlie Settens, PhD
13-4013
Building 13
60 Vassar Street (rear)
Cambridge, MA
Reservation Rules
Only qualified users can reserve and use the instrument.
Location
13-4027
60 Vassar Street (rear)
Cambridge, MA