This lecture is intended for people who want to become independent self-user of the small or wide angle X-ray scattering (SAXS) instrument in the MRL X-Ray Lab. SAXS describes the analysis of any sample that has nanostructured (1-100nm) electron density fluctuations -- i.e., nanoparticles in solution, block co-polymers, ionic liquids, soft matter, etc. Typically nanoscale electron density variations arise as structured (nanoscale object in a lattice), unstructured (in solution), or oriented (fiber or affixed to substrate) therefore treatment of each type of sample is on a case by case basis.
Students must also attend SAXSLAB instrument specific training course to learn how to put the knowledge obtained in the lecture to practice.
This lecture will survey the fundamentals of small angle X-ray scattering (SAXS), focusing on the bare essentials required to productively collect and analyze SAXS data. In addition to theory, this lecture will cover practical considerations such as common sources of error and a guide to structural interpretation and justification using SAXS patterns.
Training
This instrument training will teach users how to use the Multiwire Back-Reflection Laue Diffractometer to determine the orientation of single crystals and to determine if single crystals are possibly twinned.
This instrument training will teach users how to use the Multiwire Back-Reflection Laue Diffractometer to determine the orientation of single crystals and to determine if single crystals are possibly twinned.
This instrument training will teach users how to use the Multiwire Back-Reflection Laue Diffractometer to determine the orientation of single crystals and to determine if single crystals are possibly twinned.
This instrument training will teach users how to use the Multiwire Back-Reflection Laue Diffractometer to determine the orientation of single crystals and to determine if single crystals are possibly twinned.
This course will consist of a lecture teaching the basic principals of XRF analysis and hands-on training how to use the handheld XRF spectrometer and data analysis software to determine the elemental composition of samples.
This course will consist of a lecture teaching the basic principals of XRF analysis and hands-on training how to use the handheld XRF spectrometer and data analysis software to determine the elemental composition of samples.
This course will consist of a lecture teaching the basic principals of XRF analysis and hands-on training how to use the handheld XRF spectrometer and data analysis software to determine the elemental composition of samples.
This course will consist of a lecture teaching the basic principals of XRF analysis and hands-on training how to use the handheld XRF spectrometer and data analysis software to determine the elemental composition of samples.
This course will teach users the basics of data collection using the SAXSLAB instrument. The SAXSLAB system has automated detector positioning for SAXS/WAXS analyses of samples in capillaries or freestanding films in a transmission geometry and GISAXS/GIWAXS of samples supported on a monolithic substrate in grazing incidence reflection gemoetry. Calibration of the q-range using silver behenate, acquisition of empty, buffer (if sample is immersed in solvent) and dark current exposures for similar timescales and data reduction procedures will be covered. The SAXSLAB instrument is very well suited for analyzing polymers, soft materials, nanoparticles in solution or dried on substrates, porous samples, and nanostructured surfaces. The emphasis in this training session will be design of experiment, routine collection and data reduction.
SAXS - small angle X-ray scattering
WAXS - wide angle X-ray scattering
GISAXS - grazing incidence small angle X-ray scattering