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Aquilos Cryo-FIB/SEM

The Aquilos Cryo-FIB is a focused ion beam/scanning electron microscope system dedicated to preparation of thin lamella samples from biological or beam-sensitive materials at vitrified state. Cryo-lamellae are essentially snapshots of functional native environments whose supramolecular architecture can be studied in situ at high resolution and in 3D by electron tomography.

Cryo-electron tomography’s ability to visualize structures in their native context allows researchers to observe functional relationships and interactions with other components in the native environment. This technique promises to become an important tool for scientists seeking a better understanding of complex, electron beam sensitive systems.

Specifications/Capabilities
  • Special sample holders for shallow-angle milling of EM grids
  • Sample shuttle for autogrids: Cryo-FIB shuttle with integrated shutter system during cryo-transfers
  • In-chamber retractable sputter coater for conductive coatings application
  • GIS-system for protective coatings application
  • MAPS Software for image correlation and lamella milling
  • Non-immersion field emission-SEM column
  • Everhart-Thornley SE Detector (ETD), segmented lower (T1) and upper (T2) detectors
  • Schottky field emission gun
  • FIB-Ga Ion Source
Applications
  • Cryogenic imaging of biological and beam-sensitive materials 
  • SEM cryo-tomography of biological and beam-sensitive materials
  • Fabrication of lamellas for TEM cryo-tomography
Location

12-0160
MIT.nano (basement level)
60 Vassar Street (rear)
Cambridge, MA

Staff/Contact

Ed Brignole, PhD
Department of Biology
Assistant Director CryoEM

Christopher Borsa, PhD
Department of Biology
Research Scientist


12-0174
MIT.nano (basement level)
60 Vassar Street (rear)
Cambridge, MA

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