Past Events

3D printing glass with metastable silicates

Tuesday, February 8, 2022
11 a.m. – 11:45 a.m. EST
>>Register for this Zoom webinar.

Devon Beck, Assistant Staff
Advanced Materials and Microsystems Group
MIT Lincoln Laboratory

Additive manufacturing of glass allows the fabrication of complex structures and geometries that traditional approaches cannot achieve. However, current strategies for 3D printing glass require thermal processes over 1000°C to produce functional parts.

Beck will describe the development of low temperature process to 3D print glass and multimaterial composite glasses based on metastable silicate chemistry. The direct-write deposition process occurs at room temperature and the curing process only requires 250°C to achieve a stable glass structure. The properties of the printed glass can further be tailored in a plug-and-play fashion by introducing functional filler materials such as conductive particles.

This straight-forward strategy will enable the fabrication of a wide variety of microfluidic, electronic, and radio frequency devices with higher thermal stability without the need for extensive thermal processing.

This group training event will focus on the basic imaging and operation of the Jupiter XR AFM available at the MIT.nano cleanroom. Users will learn about specifics of the tool configuration, different imaging modes available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of an additional one-on-one supervised use session that will be coordinated with the staff member during this small group training.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.

This group training event will focus on the basic imaging and operation of the Cypher VRS AFM available in the basement level of MIT.nano (12-0195). Users will learn about basic imaging modes of the Cypher VRS AFM, cantilever selection and hand on installation, image quality improvement as well as data processing and analysis methods. Users can bring their own samples for this training. AFM probes are provided for the training; however, users must supply their own probes during further independent use. Full independent tool access will be granted upon completion of an additional one-on-one supervised use session that will be coordinated with the staff member during this small group training.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Jupiter XR AFM available at the MIT.nano cleanroom. Users will learn about specifics of the tool configuration, different imaging modes available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of an additional one-on-one supervised use session that will be coordinated with the staff member during this small group training.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300 SEM available at the MIT.nano cleanroom. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of an additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300 SEM available at the MIT.nano cleanroom. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of an additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300 SEM available at the MIT.nano cleanroom. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of an additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

* If you are a qualified user of the  Zeiss GEMINI 450 SEM at MIT.nano, you are not required to attend this training and can proceed to coordinating a 1hr supervised use session with the staff.

Electrical probing and manipulation at the nanoscale

Over the years, Imina Technologies SA has specialized in the characterization and manipulation of samples under optical and electron microscopes. The unique motion technology offered by the miBot, Imina's tiny mobile robot, allows sub-nanometric positioning resolution over large traveling ranges, unmatched ease of use and high mechanical stability.

Thanks to its versatility, the miBot can cover a large range of applications: failure analysis (EBIC/EBAC/EBIRCH), electrical probing, light collection/injection and micro/nano manipulation, among others.

After a short introduction about the technology, attendees will experience a live demonstration inside an SEM. It will demonstrate the dexterity of the robot and its ability to manipulate and electrically characterize structures at micro- and nanoscales.

>>Register.

Nano Explorations: Tuning nanoscale phase transitions to expand transformation-induced plasticity

>>Join via Zoom.

Shaolou Wei, PhD Candidate
Materials Science & Engineering

Metals and alloys have been mankind’s most essential structural materials since the Bronze Age. To seek optimal strength-ductility balance in metallic alloys, athermic phase transformations during plastic deformation are regarded as one of the most effective approaches to promote strength while impeding plastic instability incipience. Decades of efforts in ferrous alloy design have documented the significant role of strain-induced martensitic transformation in mechanical performance improvement (namely, the transformation-induced plasticity effect, TRIP).

Although it has a mechanical benefit, the resulting transformation product of the TRIP-effect, martensite, can be detrimental. The extensive defect density within the martensitic phase and the hardenability discrepancy with its adjacency can lead to local embrittlement and eventual fracture. Wei’s talk will reveal two potential solutions: a sequential martensitic transformation mechanism and a mechanical faulting response. Further insights into mechanistically-guided alloy design will also be discussed.

>>Read the full abstract.

Ultim Max 100, for Energy Dispersive Spectrometry (EDS) system was recently installed on the Gemini 450 SEM at MIT.nano.

The Ultim Max system features Silicon Drift Detector (SDD) with a 100 mm² window and is designed to maximise sensitivity and spatial resolution. 

Main specifications of Oxford Ultim Max 100 EDS and AZtecLive:

• High speed SDD Dectector (No LN2 required)
• Energy resolution: Less than 127 eV (at Mn Ka)
• Detector area: 100 mm² 
• Element detection range: Be(4) – Am(95)
• Maximum input count rate: > 150 kcps
• Software: Qualitative or Quantitative Analysis
• Analysis Modes:  Point, Circle, Polygon, Line Scan, Mapping
• Live data processing

In this workshop, Warren Moberlychan from Oxford Instruments will cover the basic AZtec and AZtecLive software capabilities.

Zoom details will be shared with the registered users.