Seeing inside: Submicron 3D X-ray microscopy in the laboratory
LOCATION: 12-0168
TIME: 10:30AM - 11:30AM
SPEAKER: Will Harris, Ph.D, Product Marketing Manager—Materials Science, ZEISS Research Microscopy Solutions
Challenges to understand three-dimensional structures have become prominent in numerous fields including energy materials, additive manufacturing, biomaterials, semiconductor devices, and geoscience. Often, the three-dimensional structure/morphology at the meso- to micro-scales can be closely correlated to the properties or performance of these systems, motivating the need to better visualize, quantify, and understand them.
X-ray microscopy offers the possibility to interrogate such samples by 3D imaging. By building on the robust and well-established technique of X-ray computed tomography but adding optical elements to extend magnification into the sub-micron world as well as additional contrast modalities, XRM provides a flexible nondestructive approach available in a laboratory-based system.
This talk will provide insight into the capabilities of the ZEISS Xradia Versa X-ray microscope at MIT.nano, how it complements other microscopy methods such as SEM, and share an array of application examples of recent research projects.
Overview of Versa 620 XRM at MIT.nano
LOCATION: 12-0163
TIME: 1:00PM-3:00PM, 3:00PM-5:00PM,
SPEAKER: Mansoureh N. Rad, PhD, Senior Applications Scientist, ZEISS Research Microscopy Solutions