This course will teach you how to profile fit data in the program HighScore Plus. Profile fitting is the first step to quantification of XRPD data. Profile fitting allows a user to extract precise information about peak position, intensity, and width. Once XRPD data have been profile fit, a variety of calculations are possible. This session will focus on refining unit cell lattice parameters, indexing diffraction data, % crystallinity, and calculating the relative weight fractions of phases in a mixture (quantitative phase analysis).
Additional workshops will focus on calculating nanocrystallite size and microstrain from peak broadening.
Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.