Training

The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings. Please register and join on zoom:
The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings. Please register and join on zoom:
The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings. Please register and join on zoom:
This course is intended to provide users with practical examples of fitting SAXS data with SASview software. Since most SAXS profiles do not exhibit well defined peaks like crystalline diffraction but instead characteristic "slopes," it is a heavily model-dependent method. After proper data reduction of a SAXS patterns, the data interpretation methods include extracting structural information from standardized plots such as Guinier, Porod, Kratky and Zimm plots. Elements of SAXS data modeling include calculations of the radius of gyration, of the single-particle form factor, inter-particle structure factors and the modeling effects of polydispersity.
This lecture is intended for people who want to become independent self-user of the small or wide angle X-ray scattering (SAXS) instrument in the MRL X-Ray Lab. SAXS describes the analysis of any sample that has nanostructured (1-100nm) electron density fluctuations -- i.e., nanoparticles in solution, block co-polymers, ionic liquids, soft matter, etc. Typically nanoscale electron density variations arise as structured (nanoscale object in a lattice), unstructured (in solution), or oriented (fiber or affixed to substrate) therefore treatment of each type of sample is on a case by case basis. Students must also attend SAXSLAB instrument specific training course to learn how to put the knowledge obtained in the lecture to practice. This lecture will survey the fundamentals of small angle X-ray scattering (SAXS), focusing on the bare essentials required to productively collect and analyze SAXS data. In addition to theory, this lecture will cover practical considerations such as common sources of error and a guide to structural interpretation and justification using SAXS patterns.
This course will teach you how to profile fit data in the program HighScore Plus. Profile fitting is the first step to quantification of XRPD data. Profile fitting allows a user to extract precise information about peak position, intensity, and width. Once XRPD data have been profile fit, a variety of calculations are possible. This session will focus on refining unit cell lattice parameters, indexing diffraction data, % crystallinity, and calculating the relative weight fractions of phases in a mixture (quantitative phase analysis). Additional workshops will focus on calculating nanocrystallite size and microstrain from peak broadening.
This workshop will introduce you to the X-ray powder diffraction data analysis software "HighScore Plus". This course will focus on phase analysis (phase ID) using HighScore Plus. Students will be practice using the interface to accomplish basic tasks such as visualizing data, fitting background, peak search; and phase analysis by comparing experimental data to reference patterns and automated search/match. This course is a pre-requisite for all advanced analysis workshops using HighScore Plus.
This class will teach students the basic operation of the Bruker D8 HRXRD instrument. The emphasis of this class will be on using triple-axis diffraction to collect data from epitaxial thin films. This session will cover collecting coupled-scans of Bragg peaks and rocking curves. This class will establish the foundation for collecting reciprocal space maps of epitaxial thin films, but the actual collection of RSMs will be covered in the separate class. This class will also cover the basis of collecting X-ray reflectivity (XRR) data from thin films.
Subscribe to Training