Training

The PANalytical Empyrean diffractometer is an excellent choice for X-ray powder/polycrystalline diffraction measurements with low background. The default mode of this instrument is in Bragg-Brentano parafocusing geometry with CuKa1,Ka2 doublet radiation. Samples can be loaded into a 45-position sample changer to input into the reflection-transmission spinner stage. The instrument has linear position sensitive detector (Pixcel 1D, max count rate: 6.5 x 10^9 cps) which permits rapid data collection up to 255 times faster than with a traditional point detector. The basic instrument training session will focus on the collection of powder diffraction data using the Bragg Brentano High Definition (BBHD) flat mirror optic, 45-position sample changer, reflection transmission spinner (in reflection geometry) and the Pixcel 1D detector. This configuration is best suited for high-speed high-resolution data collection from powders and polycrystalline thin films. Accessories include a Anton Paar CHC+ Cryo-Humidity stage. After you have completed this training, you can request individual training on the humidity stage available with this instrument. The sample temperature range is from –180 °C to +400 °C with liquid nitrogen cooling, and from –5 °C to +400 °C with compressed air cooling. The sample relative humidity range is 5 to 95 % RH at 10 °C to 60 °C and 5 to 70% RH at 80 °.  Users of this instrument should also strongly consider taking a data analysis course to suit their needs, such as the line profile fitting course for crystallite size and microstrain analysis, the Rietveld refinement series for quantitative phase analysis and unit cell analysis, or the Introduction to High Score Plus for qualitative phase identification and database search techniques. The basic instrument training session will focus on the collection of powder diffraction data using the Bragg Brentano High Definition (BBHD) flat mirror optic, 45-position sample changer, reflection transmission spinner (in reflection geometry) and the Pixcel 1D detector. This configuration is best suited for high-speed high-resolution data collection from powders and polycrystalline thin films. Accessories include a Anton Paar CHC+ Cryo-Humidity stage. After you have completed this training, you can request individual training on the humidity stage available with this instrument. The sample temperature range is from –180 °C to +400 °C with liquid nitrogen cooling, and from –5 °C to +400 °C with compressed air cooling. The sample relative humidity range is 5 to 95 % RH at 10 °C to 60 °C and 5 to 70% RH at 80 °.  Users of this instrument should also strongly consider taking a data analysis course to suit their needs, such as the line profile fitting course for crystallite size and microstrain analysis, the Rietveld refinement series for quantitative phase analysis and unit cell analysis, or the Introduction to High Score Plus for qualitative phase identification and database search techniques. SAXS - small angle X-ray scattering WAXS - wide angle X-ray scattering GISAXS - grazing incidence small angle X-ray scattering

This course will teach users the basics of data collection using the SAXSLAB instrument. The SAXSLAB system has automated detector positioning for SAXS/WAXS analyses of samples in capillaries or freestanding films in a transmission geometry and GISAXS/GIWAXS of samples supported on a monolithic substrate in grazing incidence reflection gemoetry. Calibration of the q-range using silver behenate, acquisition of empty, buffer (if sample is immersed in solvent) and dark current exposures for similar timescales and data reduction procedures will be covered. The SAXSLAB instrument is very well suited for analyzing polymers, soft materials, nanoparticles in solution or dried on substrates, porous samples, and nanostructured surfaces. The emphasis in this training session will be design of experiment, routine collection and data reduction. SAXS - small angle X-ray scattering WAXS - wide angle X-ray scattering GISAXS - grazing incidence small angle X-ray scattering

This class will teach the basics of collecting data using the Rigaku SmartLab with divergent beam and parallel-beam optics. The focus will be data collection from polycrystalline thin films using X-Ray Powder Diffraction (XRPD) techniques and Grazing Incidence X-Ray Diffraction (GIXD). The techniques will be applicable to other types of samples, such as powders and pellets. In addition, the basics of collecting X-ray reflectivity (XRR) data will be covered.

This class will teach the basics of collecting data using the Rigaku SmartLab with divergent beam and parallel-beam optics. The focus will be data collection from polycrystalline thin films using X-Ray Powder Diffraction (XRPD) techniques and Grazing Incidence X-Ray Diffraction (GIXD). The techniques will be applicable to other types of samples, such as powders and pellets. In addition, the basics of collecting X-ray reflectivity (XRR) data will be covered.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.