CHARACTERIZATION.nano

In this workshop, Dr. James C. Weaver will share the best practices of acquiring the perfect SEM image: From creating fine art quality journal covers to developing new imaging skills for effectively communicating your research Dr. James C. Weaver works at the interface between zoology, materials science, biomedical engineering, and multi-material 3D printing, where his main research interests focus on investigating structure-function relationships in hierarchically ordered biological composites and the advanced fabrication of their synthetic analogues. He has played critical roles in the development of new model systems for the study of a wide range of biomineralization processes, and is an internationally recognized and award-winning scanning electron microscopist. With a strong history of national and international academic and industrial collaborations, he has coauthored more than 150 journal articles in the biological, physical, and geological sciences. His work has been featured on the covers of more than 40 scientific journals and he has contributed to numerous collaborative art installations, which have been exhibited in Berlin, Boston, Frankfurt, London, New York, Paris, and San Francisco. Get ready to unlock the secrets to capturing not just images, but compelling narratives through your SEM work.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Bruker Icon AFM available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training. 
This training event will focus on the basic imaging and operation of the Bruker Icon AFM available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.