This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
CHARACTERIZATION.nano
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings.
Please register and join on zoom:
The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings.
Please register and join on zoom:
The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings.
Please register and join on zoom:
The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings.
Please register and join on zoom:
This lecture is intended for people who want to become independent self-user of the small or wide angle X-ray scattering (SAXS) instrument in the MRL X-Ray Lab. SAXS describes the analysis of any sample that has nanostructured (1-100nm) electron density fluctuations -- i.e., nanoparticles in solution, block co-polymers, ionic liquids, soft matter, etc. Typically nanoscale electron density variations arise as structured (nanoscale object in a lattice), unstructured (in solution), or oriented (fiber or affixed to substrate) therefore treatment of each type of sample is on a case by case basis.
Students must also attend SAXSLAB instrument specific training course to learn how to put the knowledge obtained in the lecture to practice.
This lecture will survey the fundamentals of small angle X-ray scattering (SAXS), focusing on the bare essentials required to productively collect and analyze SAXS data. In addition to theory, this lecture will cover practical considerations such as common sources of error and a guide to structural interpretation and justification using SAXS patterns.
This lecture is intended for people who want to become independent self-user of the small or wide angle X-ray scattering (SAXS) instrument in the MRL X-Ray Lab. SAXS describes the analysis of any sample that has nanostructured (1-100nm) electron density fluctuations -- i.e., nanoparticles in solution, block co-polymers, ionic liquids, soft matter, etc. Typically nanoscale electron density variations arise as structured (nanoscale object in a lattice), unstructured (in solution), or oriented (fiber or affixed to substrate) therefore treatment of each type of sample is on a case by case basis.
Students must also attend SAXSLAB instrument specific training course to learn how to put the knowledge obtained in the lecture to practice.
This lecture will survey the fundamentals of small angle X-ray scattering (SAXS), focusing on the bare essentials required to productively collect and analyze SAXS data. In addition to theory, this lecture will cover practical considerations such as common sources of error and a guide to structural interpretation and justification using SAXS patterns.