CHARACTERIZATION.nano

The Characterization.nano new user orientation is offered over zoom and aimed at providing an overview of the facility. During the orientation we provide an introduction and answer questions about the space & equipment capabilities and training offerings. Please register and join on zoom:

This class will teach the basics of collecting data using the Rigaku SmartLab with divergent beam and parallel-beam optics. The focus will be data collection from polycrystalline thin films using X-Ray Powder Diffraction (XRPD) techniques and Grazing Incidence X-Ray Diffraction (GIXD). The techniques will be applicable to other types of samples, such as powders and pellets. In addition, the basics of collecting X-ray reflectivity (XRR) data will be covered.