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ZEISS Xradia 620 Versa X-ray microscope

ZEISS Xradia 620 Versa can non-destructively characterize the 3D microstructure of materials under controlled perturbations (in situ), and observe the evolution of structures over time (4D). By leveraging Resolution at a Distance, the Xradia Versa maintains highest resolution across large working distances, accommodating both sample, environmental chamber, and high precision in-situ load rigs without sacrificing resolution. 

  • High power (25 W) X-Ray Source with energy range of 30 – 160 keV

  • Fully automatic control (filters, detectors, objectives) and reconstruction

  • High spatial resolution ~500 nm

  • A two-stage magnification- high resolution imaging at large working distances (RaaD)

  • Versatile sample sizes and types – stage travel range: X – 50 mm, Y – 100 mm, Z – 50 mm 

  • Integrated in-situ testing stages

  • DragonFly Pro for advanced 3D visualization and analysis

Versa XRM

MIT.nano (basement level)
60 Vassar Street (rear)
Cambridge, MA

  Self use 
Staff assisted 
MIT Academics    52.50 137.50
Other Academics 75.00 196.00
External                225.00 588.00

* Assistance with remote experiments will be billed at staff assisted use rate.