ZEISS Xradia 620 Versa can non-destructively characterize the 3D microstructure of materials under controlled perturbations (in situ), and observe the evolution of structures over time (4D). By leveraging Resolution at a Distance, the Xradia Versa maintains highest resolution across large working distances, accommodating both sample, environmental chamber, and high precision in-situ load rigs without sacrificing resolution.
Specifications/Capabilities
- High power (25 W) X-Ray Source with energy range of 30 – 160 keV
- Fully automatic control (filters, detectors, objectives) and reconstruction
- High spatial resolution ~500 nm
- A two-stage magnification- high resolution imaging at large working distances (RaaD)
- Versatile sample sizes and types – stage travel range: X – 50 mm, Y – 100 mm, Z – 50 mm
- Integrated in-situ testing stages
- DragonFly Pro for advanced 3D visualization and analysis
Staff/Contact
James Weaver, PhD
12-0180
Building 12
60 Vassar Street
Cambridge, MA
Jordan Cox, Ph.D
13-4013
Building 13
60 Vassar Street
Cambridge, MA
Anna Osherov, PhD
12-5005
Location
12-0163
MIT.nano (basement level)
60 Vassar Street (rear)
Cambridge, MA