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ZEISS Xradia 620 Versa X-ray microscope

ZEISS Xradia 620 Versa can non-destructively characterize the 3D microstructure of materials under controlled perturbations (in situ), and observe the evolution of structures over time (4D). By leveraging Resolution at a Distance, the Xradia Versa maintains highest resolution across large working distances, accommodating both sample, environmental chamber, and high precision in-situ load rigs without sacrificing resolution. 

Specifications/Capabilities
  • High power (25 W) X-Ray Source with energy range of 30 – 160 keV

  • Fully automatic control (filters, detectors, objectives) and reconstruction

  • High spatial resolution ~500 nm

  • A two-stage magnification- high resolution imaging at large working distances (RaaD)

  • Versatile sample sizes and types – stage travel range: X – 50 mm, Y – 100 mm, Z – 50 mm 

  • Integrated in-situ testing stages

  • DragonFly Pro for advanced 3D visualization and analysis

Versa XRM
Location

12-0163
MIT.nano (basement level)
60 Vassar Street (rear)
Cambridge, MA

Rates/$
  Self use 
($/hr)
Staff assisted 
($/hr)
MIT Academics    52.50 137.50
Other Academics 75.00 196.00
External                225.00 588.00


* Assistance with remote experiments will be billed at staff assisted use rate.