Upcoming Events

Event Date

FAB.nano 24h Qualification - May 3

10:30am to 11:00am
12-4001

All users have lab access during staffed hours (Mo-Th 8am - 9pm; Fr 8am-7pm).  To be able to use the lab after-hours and on weekends, users need to understand how to respond in emergency situations. During the 24h access qualification, a small group of PTC members ask you relevant safety questions that allow you to demonstrate your knowledge. This discussion typically takes 10-15 minutes.

Prior completion of the wet chemical training is required, as it provides the relevant safety foundations. 

 

FAB.nano New User Orientation - May 6

12:30PM – 1:00PM
MIT Zoom (link will be sent when registering)

The orientation consists of a series of self-paced videos to watch, and a 30-minute check-in over zoom, where we provide an introduction, answer questions about the lab & capabilities and how to get started, and check for any missing trainings. All cleanroom and packaging space users need to complete the orientation before card access can be granted.

Users with no prior cleanroom experience also take a half-day “quick-start” class, which provides a hands-on experience in core methods (deposition, lithography, etch). Users with prior cleanroom experience will receive a waiver during the orientation check-in. If you only need to use the packaging space (and not the cleanroom), the quick-start is not needed.

Registering for the orientation, you will get a chance to describe your general fabrication needs, helping us better understand each user’s goals and expectations. The registration form also contains a checklist to help you spot any missing EHS trainings.

After registering, you will get an email with a link to the videos to watch, and the zoom link to the orientation event.

FAB.nano New User Quick-Start - May 7

9am-noon
Fab.nano Cleanroom (12-3101)

All users without previous cleanroom work experience are required to take the quick-start training. Waivers for prior experience will be handled during the Fab.nano orientation.

The quick-start provides hands-on training to new users, by following through a simple 1-mask process in a small group. You will gain familiarity with entering the lab, handling samples, learn about deposition, lithography and etch tools, and how to verify process results.

An active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.

Because we are working in the lab, please wear long pants and full shoes

Please have the Fab.nano Orientation completed before the quick-start event.

PHI Versaprobe II XPS training - May 7

PHI XPS
9:45AM-5:00PM
Presentation on Zoom and Hands on in 13-4137
The introductory group class follows this schedule:
        9:45 - 11:30        Interactive Zoom presentation (link
        Noon to 1:00      XPS lab:  Introduction to the instrument, sample mounting, initial software set-up
        1:00 - 2:00          Break 
        2:00 - 5:00          XPS lab: analyses of trainees’ samples
 
During the lab sessions,

      •  Trainees receive a tour of PHI Versaprobe II instrument components and vacuum system design
      •  Record-keeping, sample mounting, instrument set-up and sample pumpdown are demonstrated
      •  In-lab and online resources for data analysis are introduced
      •  Data collection and analysis are demonstrated using the trainees' samples
 

The introductory group class is followed during the week by individual trainee hands-on analysis sessions, continuing analysis of the trainee’s samples. Time is pre-reserved for this purpose and is available on a first-come, first-served basis.  


With careful attention to instrument operation protocol, most users feel ready to take their “driver’s test” for self-user XPS access during their second or third hands-on session. 

The driver’s test consists of a hands-on analysis session just like the user’s previous analysis sessions -- but with each step in the operating procedure the user describes what they’re doing, and why they’re doing it, before they do it.  The user is also quizzed to confirm good understanding of the vacuum system. 

XRF Instrument and Data Analysis Training- May 7

Bruker XRF handheld
10:00AM - 11:00AM ET
13-4027 (Campus Map: https://whereis.mit.edu/ )

This course will consist of a lecture teaching the basic principals of XRF analysis and hands-on training how to use the handheld XRF spectrometer and data analysis software to determine the elemental composition of samples.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Fourier Transform Infrared (FTIR) Spectrometer Instrument Training - May 7

FTIR
1:00PM -3:00PM ET
MIT.nano 13-4139

This group training event will focus on the basic theory and operation of the Fourier Transform Infrared Spectrometer 
Users will learn about specifics of the instrument configurations, available accessories and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training in whatever form is convenient. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

FAB.nano Wet Chemical Process Training - May 7

1-2:30pm
MIT.nano (12-4001)

The Wet Chemical Process Training provides an introduction for all work with liquid chemicals in Fab.nano. Completion is required for any use of fume hoods or wet benches (including solvents, hands-on training for spin coaters, corrosive hoods and wet benches).

The training is also a prerequisite for 24-hour access to the Fab.nano facility, as it provides the relevant safety foundations.

Laue Instrument Specific Training- May 7

Laue
1:00PM - 3:00PM ET
13-4027 (Campus Map: https://whereis.mit.edu/ )

This instrument training will teach users how to use the Multiwire Back-Reflection Laue Diffractometer to determine the orientation of single crystals and to determine if single crystals are possibly twinned.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Bruker Icon XR AFM Basic Training- May 7

13:30PM -15:30PM ET
MIT.nano 13-4148

This training event will focus on the basic imaging and operation of the Bruker Icon AFM available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

The Icon XR has many SPM modes including contact and PeakForce tapping mode with ScanAsyst, Magnetic Force Microscopy, Piezo Force Microscopy, conducting atomic force microscopy (AFM). There are also additional features such as electrical characterization from 80 fA to 1 uA with 10 nm spatial resolution, Kelvin Force Probe Microscopy with amplitude or frequency feedback, and pixel-by-pixel quantitative force characterization to probe material properties. Following the basic training session, users can coordinate an advanced mode specific training with the MIT.nano staff.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Bruker Dektak DXT-A Stylus Profilometer Instrument Training - May 8

dektak
10:00AM -12:00PM ET
MIT.nano 13-4139

This group training event will focus on the basic theory and operation of the Bruker Dektak DXT-A Stylus Profilometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.