The Bruker D8 High-Resolution XRD (HRXRD) is set up to provide the best possible angular resolution for the analysis of epitaxial thin films or single crystals. Using double-axis or triple-axis diffractometer configurations, the HRXRD enables the determination of the thickness, relaxation, composition, and defect density of epitaxial layers.
Specifications/Capabilities
- Horizontal circle 2θ/θ goniometer
- 6-axis (χ-cradle) sample stage for precise 3D sample alignment
- Ge(022)x4 incident beam monochromator
- Anton Paar DHS 900 domed heating stage for in situ heating (25 – 900 °C)
- Optional triple-bounce analyzer crystal
- X-ray Source: Sealed tube: copper target
- Detectors: Scintillation counter 0D detector; LYNXEYE 1D position-sensitive detector
Related Tools
PANalytical X’Pert PRO
PANalytical Empyrean
Rigaku SmartLab
Staff/Contact
Jordan Cox, Ph.D
13-4027
Building 13
60 Vassar Street
Cambridge, MA
Charlie Settens, PhD
13-4013
Building 13
60 Vassar Street (rear)
Cambridge, MA
Reservation Rules
Only qualified users can reserve and use the instrument.
Location
13-4027
60 Vassar Street (rear)
Cambridge, MA