Themis Z instrument specific training-March 12

This training event will focus on the basic imaging and operation of the Themis Z available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Standard sample will be used during this training. Full independent tool access will be granted upon completion of additional one-on-one supervised use sessions, project specific as needed. Additional session will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Alternative times available upon request