3:00PM -4:00PM ET
13-4041 (Campus Map: https://whereis.mit.edu/ )
Image
This course is intended to provide users with practical examples of fitting SAXS data with SASview software.
Since most SAXS profiles do not exhibit well defined peaks like crystalline diffraction but instead characteristic "slopes," it is a heavily model-dependent method. After proper data reduction of a SAXS patterns, the data interpretation methods include extracting structural information from standardized plots such as Guinier, Porod, Kratky and Zimm plots. Elements of SAXS data modeling include calculations of the radius of gyration, of the single-particle form factor, inter-particle structure factors and the modeling effects of polydispersity.
Contact Name
Charlie Settens
Contact Email
settens@mit.edu
Functional Area
CHARACTERIZATION.nano
Event Type
Training
Facility
X-Ray diffraction & imaging
Spots Available
4