This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
CHARACTERIZATION.nano
This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
Please join us for an in-person workshop focused on Electrochemical Impedance Spectroscopy (EIS), July 14th, 2pm-4pm in 12-0168. In this workshop, Dino Klotz with Zurich Instruments will introduce the basics of EIS and give practical hints to avoid common errors.
Zeiss is holding a 3 day-long, in-person workshop with morning presentations (12-0168) and afternoon hands-on applications topics (12-0163). Please join us to get more familiar with the Versa 620 XRM at MIT.nano.
Oxford Instruments Asylum Research is holding a day-long, in-person workshop with morning presentations (12-0168 and on zoom) and afternoon hands-on applications topics (12-0145). Please join us for a day of getting more familiar with the Asylum Research AFMs at MIT.nano.
This training event will focus on the basic imaging and operation of the Jupiter XR AFM available at the MIT.nano cleanroom. Users will learn about specifics of the tool configuration, different imaging modes available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of an additional one-on-one supervised use session that will be coordinated with the staff member during this small group training.