The CypherS AFM is a full-featured standard AFM. It is capable of imaging topographical (including surface roughness), magnetic, electrical, mechanical and piezoelectric properties at the nanometer length scales.
Specifications/Capabilities
- Sample size <15mm.
- Motorized laser and detector alignment make quick work of instrument setup.
- blueDrive photothermal excitation makes multi-frequency techniques easier and better.
- Fast force mapping mode speeds up nanomechanical and current measurements.
- Dual gain conductive AFM increases the measurable current bandwidth.
Applications
- Simultaneous mapping at a 1000 Hz of current with either Young’s modulus and adhesion or storage and loss moduli.
- Work function variation for heterogeneous surfaces.
- d33 determination of ferroelectrics.
Resources
Please make sure to acknowledge MIT.nano Characterization in any publication, presentations, and patents involving results originated from the use of the Cypher VRS at MIT.nano Characterization Focus Facilities or through assistance from MIT.nano staff.
Suggested language: " This work was performed in part in the MIT.nano Characterization Facilities on the Cypher VRS enabled by DURIP award (N000142012203)"
Related Tools
Asylum Research Jupiter XR AFM
Agilent 5500 AFM
Bruker Dimension Icon SPM
Staff/Contact
Location
12-0195 (EM12)
MIT.nano (basement level)
60 Vassar Street (rear)
Cambridge, MA