Upcoming Events

This class will teach students the basic operation of the Bruker D8 HRXRD instrument.  The emphasis of this class will be on using triple-axis diffraction to collect data from epitaxial thin films.  This session will cover collecting coupled-scans of Bragg peaks and rocking curves.  This class will establish the foundation for collecting reciprocal space maps of epitaxial thin films, but the actual collection of RSMs will be covered in the separate class.  

This class will also cover the basis of collecting X-ray reflectivity (XRR) data from thin films.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic operation of the EDAX EDS available at Characterization.nano. This group training will cover theoretical background, software interface and strategies for Data collection. Users can bring their own samples for this training. SEM training is a prerequisite for this training. Full independent tool access will be granted upon completion of this training session.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.  

Basic SEM training is a prerequisite for this training.

This workshop will introduce you to the X-ray powder diffraction data analysis software "HighScore Plus".  This course will focus on phase analysis (phase ID) using HighScore Plus. Students will be practice using the interface to accomplish basic tasks such as visualizing data, fitting background, peak search; and phase analysis by comparing experimental data to reference patterns and automated search/match.

This course is a pre-requisite for all advanced analysis workshops using HighScore Plus.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This course will teach you how to profile fit data in the program HighScore Plus.  Profile fitting is the first step to quantification of XRPD data.  Profile fitting allows a user to extract precise information about peak position, intensity, and width. Once XRPD data have been profile fit, a variety of calculations are possible. This session will focus on refining unit cell lattice parameters, indexing diffraction data, % crystallinity, and calculating the relative weight fractions of phases in a mixture (quantitative phase analysis). 

Additional workshops will focus on calculating nanocrystallite size and microstrain from peak broadening. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.