This class will teach students the basic operation of the Bruker D8 HRXRD instrument. The emphasis of this class will be on using triple-axis diffraction to collect data from epitaxial thin films. This session will cover collecting coupled-scans of Bragg peaks and rocking curves. This class will establish the foundation for collecting reciprocal space maps of epitaxial thin films, but the actual collection of RSMs will be covered in the separate class.
This class will also cover the basis of collecting X-ray reflectivity (XRR) data from thin films.
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