Training

The Wet Chemical Process Training provides an introduction for all work with liquid chemicals in Fab.nano. Completion is required for any use of fume hoods or wet benches (including solvents, hands-on training for spin coaters, corrosive hoods and wet benches).

The training is also a prerequisite for 24-hour access to the Fab.nano facility, as it provides the relevant safety foundations.

The FAB.nano new user orientation consists of a series of self-paced videos to watch, and a 30-minute check-in over zoom, where we provide an introduction, answer questions about the lab & capabilities and how to get started, and check for any missing trainings. All cleanroom and packaging space users need to complete the orientation before card access can be granted. We hold the orientation on zoom: https://mit.zoom.us/j/91225350168 Before attending the session, please watch the set of videos posted at: https://www.dropbox.com/sh/dsq2jzq7f2iryym/AABNHUzBkiRxrXR_PLV5vjxXa?dl=0 Note: The characterization capabilities (video 3) is empty and will be discussed during the zoom session. Please do not distribute/download/forward these videos, as they are still heavily being modified and corrected. But any feedback on content or style is very welcome.

The FAB.nano new user orientation consists of a series of self-paced videos to watch, and a 30-minute check-in over zoom, where we provide an introduction, answer questions about the lab & capabilities and how to get started, and check for any missing trainings. All cleanroom and packaging space users need to complete the orientation before card access can be granted. We hold the orientation on zoom: https://mit.zoom.us/j/91225350168 Before attending the session, please watch the set of videos posted at: https://www.dropbox.com/sh/dsq2jzq7f2iryym/AABNHUzBkiRxrXR_PLV5vjxXa?dl=0 Note: The characterization capabilities (video 3) is empty and will be discussed during the zoom session. Please do not distribute/download/forward these videos, as they are still heavily being modified and corrected. But any feedback on content or style is very welcome.

The FAB.nano new user orientation consists of a series of self-paced videos to watch, and a 30-minute check-in over zoom, where we provide an introduction, answer questions about the lab & capabilities and how to get started, and check for any missing trainings. All cleanroom and packaging space users need to complete the orientation before card access can be granted. We hold the orientation on zoom: https://mit.zoom.us/j/91225350168 Before attending the session, please watch the set of videos posted at: https://www.dropbox.com/sh/dsq2jzq7f2iryym/AABNHUzBkiRxrXR_PLV5vjxXa?dl=0 Note: The characterization capabilities (video 3) is empty and will be discussed during the zoom session. Please do not distribute/download/forward these videos, as they are still heavily being modified and corrected. But any feedback on content or style is very welcome.

The FAB.nano new user orientation consists of a series of self-paced videos to watch, and a 30-minute check-in over zoom, where we provide an introduction, answer questions about the lab & capabilities and how to get started, and check for any missing trainings. All cleanroom and packaging space users need to complete the orientation before card access can be granted. We hold the orientation on zoom: https://mit.zoom.us/j/91225350168 Before attending the session, please watch the set of videos posted at: https://www.dropbox.com/sh/dsq2jzq7f2iryym/AABNHUzBkiRxrXR_PLV5vjxXa?dl=0 Note: The characterization capabilities (video 3) is empty and will be discussed during the zoom session. Please do not distribute/download/forward these videos, as they are still heavily being modified and corrected. But any feedback on content or style is very welcome.

This training event will focus on the basic imaging and operation of the Bruker Icon AFM available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training. 

This training event will focus on the basic imaging and operation of the Bruker Icon AFM available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training. 

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training. 

This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.