This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
Training
This training event will focus on the basic imaging and operation of the Zeiss Merlin SEM available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.
All users have lab access during staffed hours (Mo-Th 8am - 9pm; Fr 8am-7pm). To be able to use the lab after-hours and on weekends, users need to understand how to respond in emergency situations. During the 24h access qualification, a small group of PTC members ask you relevant safety questions that allow you to demonstrate your knowledge. This discussion typically takes 10-15 minutes.