This course will teach users the basics of data collection using the SAXSLAB instrument. The SAXSLAB system has automated detector positioning for SAXS/WAXS analyses of samples in capillaries or freestanding films in a transmission geometry and GISAXS/GIWAXS of samples supported on a monolithic substrate in grazing incidence reflection gemoetry. Calibration of the q-range using silver behenate, acquisition of empty, buffer (if sample is immersed in solvent) and dark current exposures for similar timescales and data reduction procedures will be covered. The SAXSLAB instrument is very well suited for analyzing polymers, soft materials, nanoparticles in solution or dried on substrates, porous samples, and nanostructured surfaces. The emphasis in this training session will be design of experiment, routine collection and data reduction.
SAXS - small angle X-ray scattering
WAXS - wide angle X-ray scattering
GISAXS - grazing incidence small angle X-ray scattering
CHARACTERIZATION.nano
This course is intended to provide users with practical examples of fitting SAXS data with SASview software.
Since most SAXS profiles do not exhibit well defined peaks like crystalline diffraction but instead characteristic "slopes," it is a heavily model-dependent method. After proper data reduction of a SAXS patterns, the data interpretation methods include extracting structural information from standardized plots such as Guinier, Porod, Kratky and Zimm plots. Elements of SAXS data modeling include calculations of the radius of gyration, of the single-particle form factor, inter-particle structure factors and the modeling effects of polydispersity.
This course is intended to provide users with practical examples of fitting SAXS data with SASview software.
Since most SAXS profiles do not exhibit well defined peaks like crystalline diffraction but instead characteristic "slopes," it is a heavily model-dependent method. After proper data reduction of a SAXS patterns, the data interpretation methods include extracting structural information from standardized plots such as Guinier, Porod, Kratky and Zimm plots. Elements of SAXS data modeling include calculations of the radius of gyration, of the single-particle form factor, inter-particle structure factors and the modeling effects of polydispersity.
This course is intended to provide users with practical examples of fitting SAXS data with SASview software.
Since most SAXS profiles do not exhibit well defined peaks like crystalline diffraction but instead characteristic "slopes," it is a heavily model-dependent method. After proper data reduction of a SAXS patterns, the data interpretation methods include extracting structural information from standardized plots such as Guinier, Porod, Kratky and Zimm plots. Elements of SAXS data modeling include calculations of the radius of gyration, of the single-particle form factor, inter-particle structure factors and the modeling effects of polydispersity.
This course is intended to provide users with practical examples of fitting SAXS data with SASview software.
Since most SAXS profiles do not exhibit well defined peaks like crystalline diffraction but instead characteristic "slopes," it is a heavily model-dependent method. After proper data reduction of a SAXS patterns, the data interpretation methods include extracting structural information from standardized plots such as Guinier, Porod, Kratky and Zimm plots. Elements of SAXS data modeling include calculations of the radius of gyration, of the single-particle form factor, inter-particle structure factors and the modeling effects of polydispersity.
Oxford Instruments Asylum Research AFM & WITec Raman) is holding a day-long, in-person workshop with morning presentations (12-0168) and afternoon hands-on applications topics (12-0145). Please join us for an informative day on advanced AFM and Raman capabilities at MIT.nano.
In this training theory and basics operation of the Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer will be covered.
We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment.
This is usually two session 2 hours each. During the first session we will run a DEMO samples and we will discuss your sample preparation. For your second session Instructor will assist you run your samples. Second session will be scheduled at the end of this session.
In this training theory and basics operation of the Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer will be covered.
We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment.
This is usually two session 2 hours each. During the first session we will run a DEMO samples and we will discuss your sample preparation. For your second session Instructor will assist you run your samples. Second session will be scheduled at the end of this session.
This training event will focus on the basic imaging and operation of the Themis Z available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. Standard sample will be used during this training. Full independent tool access will be granted upon completion of additional one-on-one supervised use sessions, project specific as needed. Additional session will be coordinated with the staff member during this small group training.
This training event will focus on the basic imaging and operation of the Zeiss SEM's available at MIT.nano Characterization Facilities. Users will learn about specifics of the tool configuration, different imaging detectors available and strategies for image quality improvement. We'll use standard sample for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.