The Gemini 450 SEM, from Zeiss, is a field emission scanning electron microscope. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use.
- Magnification: x12-2M
- Acceleration: Voltage 0.02-30kV
- Probe current: 3pA-40nA
- 5-axes motorized eucentric specimen stage (X,Y=130mm, Z=50mm, T=-4deg-70deg, R-360deg)
- Everhart Thornley Secondary Electron Detector
- Inlens Secondary Electron Detector
- Inlens Energy Selective Backscatteres Electron Detector (EsB)
- High efficiency Variable Pressure Secondary electron Detector (VPSE)
- Angular selective Backscattered Detector
- Annular STEM Detector (aSTEM4)
- Oxford AZtec 100 EDS Detector
- High Vacuum (HV) mode – standard mode for analyzing conductive specimens.
- Variable Presurre (VP) mode – beneficial for imaging non-conductive specimens without additional specimen preparation. The partial pressure in the chamber is between 5 – 30Pa.
- Nano VP mode – enhanced VP mode with an inserted Beamsleeve aperture below the objective lens. The partial pressure in the chamber is 5 – 150Pa (350 μm Beamsleeve aperture) or 5 – 40Pa (800 μm Beamsleeve aperture).
Please make sure to acknowledge MIT.nano Characterization in any publication, presentations, and patents involving results originated from the use of the Gemini 450 SEM at MIT.nano Characterization Focus Facilities or through assistance from MIT.nano staff.
Suggested language: " This work was performed in part in the MIT.nano Characterization Facilities"
MIT.nano (basement level)
60 Vassar Street (rear)
* Introductory rates valid for 2020
Only qualified users can reserve and use the instrument. The reservations are limited to 6 hr instrument time.
Anna Osherov, PhD
James M. Daley
ASSISTED USE /TRAINING REQUEST