Past Events

This class will teach students the basic operation of the Bruker D8 HRXRD instrument.  The emphasis of this class will be on using triple-axis diffraction to collect data from epitaxial thin films.  This session will cover collecting coupled-scans of Bragg peaks and rocking curves.  This class will establish the foundation for collecting reciprocal space maps of epitaxial thin films, but the actual collection of RSMs will be covered in the separate class.  

This class will also cover the basis of collecting X-ray reflectivity (XRR) data from thin films.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. This is usually two session <2hours each. During the first session we will run a DEMO samples and we will discuss your sample preparation. For your second session Instructor will assist you run your samples.  Second session will be scheduled at the end of this session. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment.  Full independent tool access will be granted upon completion of both training sessions.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300, Zeiss Gemini 450 and Zeiss Merlin SEM's available at Characterization.nano. Users will learn about specifics of the instrument configurations, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Perkin Elmer 1050 UVVISNIR Spectrophotometer
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

The PANalytical Empyrean diffractometer is an excellent choice for X-ray powder/polycrystalline diffraction measurements with low background. The default mode of this instrument is in Bragg-Brentano parafocusing geometry with CuKa1,Ka2 doublet radiation. Samples can be loaded into a 45-position sample changer to input into the reflection-transmission spinner stage. The instrument has linear position sensitive detector (Pixcel 1D, max count rate: 6.5 x 10^9 cps) which permits rapid data collection up to 255 times faster than with a traditional point detector.

The basic instrument training session will focus on the collection of powder diffraction data using the Bragg Brentano High Definition (BBHD) flat mirror optic, 45-position sample changer, reflection transmission spinner (in reflection geometry) and the Pixcel 1D detector.  This configuration is best suited for high-speed high-resolution data collection from powders and polycrystalline thin films.

Accessories include a Anton Paar CHC+ Cryo-Humidity stage. After you have completed this training, you can request individual training on the humidity stage available with this instrument. 

Users of this instrument should also strongly consider taking a data analysis course to suit their needs, such as the line profile fitting course for crystallite size and microstrain analysis, the Rietveld refinement series for quantitative phase analysis and unit cell analysis, or the Introduction to High Score Plus for qualitative phase identification and database search techniques.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Bruker Dektak DXT-A Stylus Profilometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

The Wet Chemical Process Training provides an introduction for all work with liquid chemicals in Fab.nano. Completion is required for any use of fume hoods or wet benches (including solvents, hands-on training for spin coaters, corrosive hoods and wet benches).

The training is also a prerequisite for 24-hour access to the Fab.nano facility, as it provides the relevant safety foundations.

Characterization.nano orientation provides an introduction to MIT.nano advanced measurement and characterization capabilities with emphasis on the state-of-the-art equipment located outside the MIT.nano cleanroom facilities and in build 13.

Completion is recommended to those interested in accessing Characterization.nano instrumentation located in the non-cleanroom spaces only. Those seeking to access metrology instrumentation located both inside and outside the cleanroom facilities, have to complete MIT.nano fab and metrology combined orientation. The MIT.nano characterization orientation components include:

1. Broad overview of the different facilities and capabilities at MIT.nano. Emphasis will be made on advanced imaging and analysis capabilities;
2. Background on how work is conducted on MIT.nano's shared equipment;
3. Brief overview of characterization work safety rules;
4. Virtual Tour through the different characterization lab spaces. Participants are encouraged to ask questions to relate MIT.nano capabilities to their research interests and needs.

After registering, you will get an email with zoom link to the orientation event.

All users without previous cleanroom work experience are required to take the quick-start training. Waivers for prior experience will be handled during the Fab.nano orientation.

The quick-start provides hands-on training to new users, by following through a simple 1-mask process in a small group. You will gain familiarity with entering the lab, handling samples, learn about deposition, lithography and etch tools, and how to verify process results.

An active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.

Because we are working in the lab, please wear long pants and full shoes

Please have the Fab.nano Orientation completed before the quick-start event.