Past Events

Characterization.nano orientation provides an introduction to MIT.nano advanced measurement and characterization capabilities with emphasis on the state-of-the-art equipment located outside the MIT.nano cleanroom facilities and in build 13.

Completion is recommended to those interested in accessing Characterization.nano instrumentation located in the non-cleanroom spaces only. Those seeking to access metrology instrumentation located both inside and outside the cleanroom facilities, have to complete MIT.nano fab and metrology combined orientation. The MIT.nano characterization orientation components include:

1. Broad overview of the different facilities and capabilities at MIT.nano. Emphasis will be made on advanced imaging and analysis capabilities;
2. Background on how work is conducted on MIT.nano's shared equipment;
3. Brief overview of characterization work safety rules;
4. Virtual Tour through the different characterization lab spaces. Participants are encouraged to ask questions to relate MIT.nano capabilities to their research interests and needs.

After registering, you will get an email with zoom link to the orientation event.

All users without previous cleanroom work experience are required to take the quick-start training. Waivers for prior experience will be handled during the Fab.nano orientation.

The quick-start provides hands-on training to new users, by following through a simple 1-mask process in a small group. You will gain familiarity with entering the lab, handling samples, learn about deposition, lithography and etch tools, and how to verify process results.

An active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.

Because we are working in the lab, please wear long pants and full shoes

Please have the Fab.nano Orientation completed before the quick-start event.

This training event will focus on the basic imaging and operation of the Cypher S and VRS AFM's available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Quantum Design Inc. Magnetic Property Measurement System (MPMS-3). Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. 

Please review the MPMS Introduction video prior to the training

After this session you can schedule time to run your sample(s).
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

All users have lab access during staffed hours (Mo-Th 8am - 9pm; Fr 8am-7pm).  To be able to use the lab after-hours and on weekends, users need to understand how to respond in emergency situations. During the 24h access qualification, a small group of PTC members ask you relevant safety questions that allow you to demonstrate your knowledge. This discussion typically takes 10-15 minutes.

Prior completion of the wet chemical training is required, as it provides the relevant safety foundations. 

This group training event will focus on the basic operation of the EDAX EDS available at Characterization.nano. This group training will cover theoretical background, software interface and strategies for Data collection. Users can bring their own samples for this training. SEM training is a prerequisite for this training. Full independent tool access will be granted upon completion of this training session.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.  

Basic SEM training is a prerequisite for this training.

This group training event will focus on the basic theory and operation of the Renishaw Invia Reflex Micro Raman
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Date: Thursday, April 11, 2024
Time: 10:30 a.m. – 4:30 p.m. ET
Location: 12-0168 (MIT.nano basement)
Lunch will be provided to registered participants, sponsored by Gatan/EDAX

Register for this talk

ABSTRACT

10:30AM – 11:30 AM: Quantifying lithium in the SEM using Cipher (EDS/qBSE)
Shangshang Mu, Application Scientist
In recent years, Lithium- (Li-) based products have gained significant market acceptance in a diverse range of energy storage applications, owing to their superior capacity and lighter mass. However, there remains considerable potential for enhancing the capacity and efficiency of these energy storage materials by optimizing the elemental composition and structural properties. Specifically, due to the lack of suitable characterization techniques at the micro and nano scales, the degradation mechanisms and structural evolution have not yet been sufficiently studied. 
The in-person workshop will introduce the EDS and quantitative backscattered imaging. New technology with the potential to revolutionize research on Li-ion batteries and Li alloys, Cipher, will be presented, demonstrating the ability to quantitatively map the distribution of Li at the microscopic level across a diverse variety of materials. The advent of this innovative characterization method is expected to play a crucial role in advancing Li materials research.
11:30 – 12:15 am: The Future of EBSD Indexing Methods: Spherical Indexing and its Applications
Shawn Wallace, Application Scientist
Traditional EBSD indexing methods use the Hough transform, which has been used since essentially the beginning of the automation of EBSD. The Hough Transform was originally used due to its scalability (up and down) computationally to allow for live indexing of patterns. This scalability was due to how the Hough Transform reduces the data used down to levels the CPU could run in a reasonable time. This method ignored a lot of potentially useful information in the patterns. New forward model indexing techniques have recently become available, allowing for improved EBSD indexing performance by comparing experimental EBSD patterns with simulated patterns to find the best match.  One implementation of this approach is termed spherical indexing, which can use modern GPU to provide an improved index at rates over 10,000 points per second. This talk with discuss how SI works and how it opens up the application space to address questions researchers could previously not.
12:15PM-1:00PM: Lunch (sponsored by Gatan/EDAX)
1-4:30 pm: EBSD data indexing demonstration and Q/A

This group training event will focus on the basic theory and operation of the Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. This is usually two session <2hours each. During the first session we will run a DEMO samples and we will discuss your sample preparation. For your second session Instructor will assist you run your samples.  Second session will be scheduled at the end of this session. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment.  Full independent tool access will be granted upon completion of both training sessions.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300, Zeiss Gemini 450 and Zeiss Merlin SEM's available at Characterization.nano. Users will learn about specifics of the instrument configurations, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.