Past Events

All users have lab access during staffed hours (Mo-Th 8am - 9pm; Fr 8am-7pm).  To be able to use the lab after-hours and on weekends, users need to understand how to respond in emergency situations. During the 24h access qualification, a small group of PTC members ask you relevant safety questions that allow you to demonstrate your knowledge. This discussion typically takes 10-15 minutes.

Prior completion of the wet chemical training is required, as it provides the relevant safety foundations. 

This group training event will focus on the basic operation of the EDAX EDS available at Characterization.nano. This group training will cover theoretical background, software interface and strategies for Data collection. Users can bring their own samples for this training. SEM training is a prerequisite for this training. Full independent tool access will be granted upon completion of this training session.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.  

Basic SEM training is a prerequisite for this training.

This class will teach the basics of collecting data using the Rigaku SmartLab with divergent beam and parallel-beam optics.  The focus will be data collection from polycrystalline thin films using X-Ray Powder Diffraction (XRPD) techniques and Grazing Incidence X-Ray Diffraction (GIXD).  The techniques will be applicable to other types of samples, such as powders and pellets. In addition, the basics of collecting X-ray reflectivity (XRR) data will be covered.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Renishaw Invia Reflex Micro Raman
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Agilent 5100 DVD Inductively Coupled Plasma-Optical Emission Spectrometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. This is usually two session <2hours each. During the first session we will run a DEMO samples and we will discuss your sample preparation. For your second session Instructor will assist you run your samples.  Second session will be scheduled at the end of this session. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment.  Full independent tool access will be granted upon completion of both training sessions.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300, Zeiss Gemini 450 and Zeiss Merlin SEM's available at Characterization.nano. Users will learn about specifics of the instrument configurations, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Date: April 3, 2024
Time: 4:00 p.m. ET
Location: 12-0168 

RSVP

Join us for the inaugural Characterization User Forum:

   * Get to know your Characterization community.

   * Bring questions about your data.

   * Share your feedback in the user-led town hall.

   * Stay up to date with facility news.

   * Food and drink will be provided.

The first user forum will include a talk by:
Menglin Zhu, Postdoctoral Researcher, LeBeau Group, DMSE
“Microscopic Insight into Ultrahigh Electromechanical Responses: In-situ Biasing of Antiferroelectric PbZrO3 Thin Films”

This group training event will focus on the basic theory and operation of the Perkin Elmer 1050 UVVISNIR Spectrophotometer
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This group training event will focus on the basic theory and operation of the Bruker Dektak DXT-A Stylus Profilometer 
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

This training event will focus on the basic imaging and operation of the Bruker Icon AFM available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

The Icon XR has many SPM modes including contact and PeakForce tapping mode with ScanAsyst, Magnetic Force Microscopy, Piezo Force Microscopy, conducting atomic force microscopy (AFM). There are also additional features such as electrical characterization from 80 fA to 1 uA with 10 nm spatial resolution, Kelvin Force Probe Microscopy with amplitude or frequency feedback, and pixel-by-pixel quantitative force characterization to probe material properties. Following the basic training session, users can coordinate an advanced mode specific training with the MIT.nano staff.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.