The Gemini 450 SEM, from Zeiss, is a field emission scanning electron microscope. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use.
- Magnification: x12-2M
- Acceleration: Voltage 0.02-30kV
- Probe current: 3pA-40nA
- 5-axes motorized eucentric specimen stage (X,Y=130mm, Z=50mm, T=-4deg-70deg, R-360deg)
- Everhart Thornley Secondary Electron Detector
- Inlens Secondary Electron Detector
- Inlens Energy Selective Backscatteres Electron Detector (EsB)
- High efficiency Variable Pressure Secondary electron Detector (VPSE)
- Angular selective Backscattered Detector
- Annular STEM Detector (aSTEM4)
- High Vacuum (HV) mode – standard mode for analyzing conductive specimens.
- Variable Presurre (VP) mode – beneficial for imaging non-conductive specimens without additional specimen preparation. The partial pressure in the chamber is between 5 – 30Pa.
- Nano VP mode – enhanced VP mode with an inserted Beamsleeve aperture below the objective lens. The partial pressure in the chamber is 5 – 150Pa (350 μm Beamsleeve aperture) or 5 – 40Pa (800 μm Beamsleeve aperture).
MIT.nano (basement level)
60 Vassar Street (rear)
* Introductory rates valid for 2020
Prior electron microscopy imaging experience is required to become an independent user
Please fill Gemini 450 SEM-Imaging Vault form prior to your first session and update as needed!