The Bruker Discover Plus is a flexible system that uses a 0D, 1D or 2D detector and small, point-focus X-ray beam to study high resolution XRD (HRXRD) or X-ray reflectivity (XRR) of epitaxial thin films, texture, or residual stress. The instrument can also be used to collect powder or bulk polycrystalline diffraction on small spots 2mm diameter or smaller. It can collect single-crystal diffraction data sufficient for orientation/unit cell determination or transmission measurements of polymers.
- Microfocus Copper X-ray source
- Horizontal θ/θ goniometer
- 5-axis Centric Eulerian cradle for precise 3D sample alignment (x, y, z, φ, ψ axes)
- Exchangeable collimator tubes for variable beam size (2mm – 0.3 μm)
- Anton Paar DHS 1100 domed heating stage for in situ heating (25 – 1100 °C)
- Integrated camera for precise location and mapping
X-ray Source: Microfocus copper source
Detectors: Eiger2R 2D area detector
PANalytical X’Pert PRO
PANalytical Empyrean
Rigaku SmartLab
SAXSLAB Retro-F
ZEISS Xradia 620 Versa X-ray microscope
Jordan Cox, Ph.D
13-4013
Building 13
60 Vassar Street
Cambridge, MA
Charlie Settens, PhD
13-4013
Building 13
60 Vassar Street (rear)
Cambridge, MA
ASSISTED USE / TRAINING REQUEST
Only qualified users can reserve and use the instrument.
13-4027