Past Events

PHI Versaprobe II XPS training - May 21

PHI XPS
9:45AM-5:00PM
Presentation on Zoom and Hands on in 13-4137
The introductory group class follows this schedule:
        9:45 - 11:30        Interactive Zoom presentation (link
        Noon to 1:00      XPS lab:  Introduction to the instrument, sample mounting, initial software set-up
        1:00 - 2:00          Break 
        2:00 - 5:00          XPS lab: analyses of trainees’ samples
 
During the lab sessions,

      •  Trainees receive a tour of PHI Versaprobe II instrument components and vacuum system design
      •  Record-keeping, sample mounting, instrument set-up and sample pumpdown are demonstrated
      •  In-lab and online resources for data analysis are introduced
      •  Data collection and analysis are demonstrated using the trainees' samples
 

The introductory group class is followed during the week by individual trainee hands-on analysis sessions, continuing analysis of the trainee’s samples. Time is pre-reserved for this purpose and is available on a first-come, first-served basis.  


With careful attention to instrument operation protocol, most users feel ready to take their “driver’s test” for self-user XPS access during their second or third hands-on session. 

The driver’s test consists of a hands-on analysis session just like the user’s previous analysis sessions -- but with each step in the operating procedure the user describes what they’re doing, and why they’re doing it, before they do it.  The user is also quizzed to confirm good understanding of the vacuum system. 

FAB.nano New User Quick-Start - May 21

9am-noon
Fab.nano Cleanroom (12-3101)

All users without previous cleanroom work experience are required to take the quick-start training. Waivers for prior experience will be handled during the Fab.nano orientation.

The quick-start provides hands-on training to new users, by following through a simple 1-mask process in a small group. You will gain familiarity with entering the lab, handling samples, learn about deposition, lithography and etch tools, and how to verify process results.

An active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.

Because we are working in the lab, please wear long pants and full shoes

Please have the Fab.nano Orientation completed before the quick-start event.

FAB.nano New User Orientation - May 20

1:30PM – 2:00PM
MIT Zoom (link will be sent when registering)

The orientation consists of a series of self-paced videos to watch, and a 30-minute check-in over zoom, where we provide an introduction, answer questions about the lab & capabilities and how to get started, and check for any missing trainings. All cleanroom and packaging space users need to complete the orientation before card access can be granted.

Users with no prior cleanroom experience also take a half-day “quick-start” class, which provides a hands-on experience in core methods (deposition, lithography, etch). Users with prior cleanroom experience will receive a waiver during the orientation check-in. If you only need to use the packaging space (and not the cleanroom), the quick-start is not needed.

Registering for the orientation, you will get a chance to describe your general fabrication needs, helping us better understand each user’s goals and expectations. The registration form also contains a checklist to help you spot any missing EHS trainings.

After registering, you will get an email with a link to the videos to watch, and the zoom link to the orientation event.

FAB.nano 24h Qualification - May 17

10:30am to 11:00am
12-4001

All users have lab access during staffed hours (Mo-Th 8am - 9pm; Fr 8am-7pm).  To be able to use the lab after-hours and on weekends, users need to understand how to respond in emergency situations. During the 24h access qualification, a small group of PTC members ask you relevant safety questions that allow you to demonstrate your knowledge. This discussion typically takes 10-15 minutes.

Prior completion of the wet chemical training is required, as it provides the relevant safety foundations. 

 

Basics of EDS in SEM and Instrument Specific Training - May 16

1:00PM -4:00PM ET
13-1026 (The Zeiss Merlin SEM lab is in 13-1012 EM suite. You can get to 13-1012 through the black door at the west end of Build

This group training event will focus on the basic operation of the EDAX EDS available at Characterization.nano. This group training will cover theoretical background, software interface and strategies for Data collection. Users can bring their own samples for this training. SEM training is a prerequisite for this training. Full independent tool access will be granted upon completion of this training session.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.  

Basic SEM training is a prerequisite for this training.

Zeiss Merlin SEM training -May 16

10:00AM -12:00PM ET
13-1026 (The Zeiss Merlin SEM lab is in 13-1012 EM suite. You can get to 13-1012 through the black door at the west end of Build 9

This group training event will focus on the basic imaging and operation of the Zeiss SIGMA 300, Zeiss Gemini 450 and Zeiss Merlin SEM's available at Characterization.nano. Users will learn about specifics of the instrument configurations, different imaging detectors available and strategies for image quality improvement. Users can bring their own samples for this training. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use session that will be coordinated with the staff member during this small group training. 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Rigaku SmartLab XRPD Instrument Training - May 13

smartlab
1:00PM -3:00PM ET
13-4027 (Campus Map: https://whereis.mit.edu/ )

This class will teach the basics of collecting data using the Rigaku SmartLab with divergent beam and parallel-beam optics.  The focus will be data collection from polycrystalline thin films using X-Ray Powder Diffraction (XRPD) techniques and Grazing Incidence X-Ray Diffraction (GIXD).  The techniques will be applicable to other types of samples, such as powders and pellets. In addition, the basics of collecting X-ray reflectivity (XRR) data will be covered.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Perkin Elmer 1050 UVVISNIR Spectrophotometer Instrument Training - May 15

UvVis
1:00PM -3:00PM ET
MIT.nano 13-4139

This group training event will focus on the basic theory and operation of the Perkin Elmer 1050 UVVISNIR Spectrophotometer
Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. Users can bring their own (non-hazardous) samples for this training. We will work together until we are both comfortable with your safe and successful operation of the instrument in a shared facility environment. This is usually one session <2hours. Full independent tool access will be granted upon completion of this training session.
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Quantum Design Inc. Magnetic Property Measurement System (MPMS-3) Introduction Training - May 15

MPMS
10:00AM -12:00PM ET
MIT.nano 13-4139

This group training event will focus on the basic theory and operation of the Quantum Design Inc. Magnetic Property Measurement System (MPMS-3). Users will learn about specifics of the instrument capabilities and strategies for data collection and data quality improvement. 

Please review the MPMS Introduction video prior to the training

After this session you can schedule time to run your sample(s).
 

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event. 

Bruker Icon XR AFM Basic Training- May 14

13:30PM -15:30PM ET
MIT.nano 13-4148

This training event will focus on the basic imaging and operation of the Bruker Icon AFM available at MIT.nano Characterization Facilities. Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. Users can bring their own samples for this training and SPM probes are provided. Notice, users must supply their own probes for followup qualification sessions. Full independent tool access will be granted upon completion of 2 additional one-on-one supervised use sessions that will be coordinated with the staff member during this small group training.

The Icon XR has many SPM modes including contact and PeakForce tapping mode with ScanAsyst, Magnetic Force Microscopy, Piezo Force Microscopy, conducting atomic force microscopy (AFM). There are also additional features such as electrical characterization from 80 fA to 1 uA with 10 nm spatial resolution, Kelvin Force Probe Microscopy with amplitude or frequency feedback, and pixel-by-pixel quantitative force characterization to probe material properties. Following the basic training session, users can coordinate an advanced mode specific training with the MIT.nano staff.

Active MIT.nano user account is required to participate in this training. Please setup an account prior to registering for the training event.