Instruments FEI Tecnai Multipurpose Digital TEM FEI Helios Nanolab 600 Dual Beam System Gemini 450 SEM JEOL 2010 FEG Analytical Electron Microscope JEOL 2011 High Contrast TEM Sigma HD VP SEM Themis Z G3 Cs-Corrected S/TEM Velion FIB-SEM Zeiss Merlin High-resolution SEM Hitachi HF500 Environmental S/TEM See scheduled group trainings for Electron Microscopy instruments
